DocumentCode
2804777
Title
Fundamental analysis of lateral displacement estimation quality in ultrasound elastography
Author
Luo, Jianwen ; Konofagou, Elisa E.
Author_Institution
Dept. of Biomed. Eng., Columbia Univ., New York, NY, USA
fYear
2009
fDate
June 28 2009-July 1 2009
Firstpage
462
Lastpage
465
Abstract
Complementary to axial, lateral displacement and strain can provide important information on the biological soft tissues in all applications of elastography. In this paper, the effect of key parameters on the lateral displacement estimation was investigated, in simulations and phantom experiments. The performance of the lateral estimator was evaluated by measuring its associated bias, jitter and correlation coefficient of radio-frequency (RF) signals. Simulation results showed that the bias, jitter and correlation coefficient undergo periodic variations depending on the lateral displacement, with a period equal to the pitch (i.e., adjacent element distance). The performance of the lateral estimation was improved, when a smaller pitch, or a larger beamwidth, was used. The results of the ph4antom experiments were shown to be in good agreement with the simulation findings, including the periodic variation of the performance with lateral displacement, effect of pitch and beamwidth. In conclusion, smaller pitch and wider beamwidth were found to be the key in reducing the jitter error in the lateral displacement estimation.
Keywords
biomechanics; biomedical ultrasonics; elasticity; jitter; medical image processing; phantoms; beamwidth; correlation coefficient; jitter; lateral displacement estimation; phantom; pitch; radio-frequency signals; ultrasound elastography; ultrasound imaging; Acoustic scattering; Biological tissues; Capacitive sensors; Imaging phantoms; Jitter; Motion estimation; Radio frequency; Sampling methods; Ultrasonic imaging; Ultrasonic transducers; Beamwidth; Bias; Elastography; Jitter; Lateral; Pitch;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1945-7928
Print_ISBN
978-1-4244-3931-7
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2009.5193084
Filename
5193084
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