DocumentCode
2804794
Title
Secondary emission modelling for depressed collectors in PIERCE
Author
Kumar, Lalit ; Rao, P. Raja Ramana
Author_Institution
Microwave Tube Res. & Dev. Centre, Bangalore, India
fYear
2003
fDate
28-30 May 2003
Firstpage
14
Lastpage
15
Abstract
In secondary emission modelling programs, the total secondary emission yield is generally estimated using semi-empirical formulae proposed by Vaughan. The backscattered yield is often estimated simply as a constant fraction of the total yield, which is too simplistic, or by using a polynomial fit to the experimental data. The angular distribution of backscattered electrons on the energy and incident angle using the functional dependence.
Keywords
electron backscattering; electron guns; polynomials; secondary electron emission; angular distribution; backscattered electrons; depressed collectors; polynomial equation; secondary electron emission modelling; Copper; Electrodes; Electron emission; Electron optics; Electron tubes; Modems; Polynomials; Surface fitting; Yield estimation; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics, 2003 4th IEEE International Conference on
Print_ISBN
0-7803-7699-4
Type
conf
DOI
10.1109/IVEC.2003.1286001
Filename
1286001
Link To Document