• DocumentCode
    2804986
  • Title

    Ultra-low volume ferromagnetic nanodots for field-coupled computing devices

  • Author

    Kiermaier, J. ; Breitkreutz, S. ; Ju, X. ; Csaba, G. ; Schmitt-Landsiedel, D. ; Becherer, M.

  • Author_Institution
    Lehrstuhl fur Tech. Elektron., Tech. Univ. Munchen, Munich, Germany
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    214
  • Lastpage
    217
  • Abstract
    Focused ion beam irradiation on ferromagnetic Co/Pt films permits controlled modification of the coercivity. This is demonstrated experimentally and mapped to micro-magnetic simulations. Temperature measurements prove the thermal stability of films and nanodots in an application relevant temperature range. For the first time, Extraordinary Hall-Effect measurements are performed at a single-domain ferromagnetic nanodot with a target size of 250 nm in a Hall current device. This verifies the thermal stability and the read-out ability of the magnetic bistable states. Thus, the ultra-low volume magnetic Co/Pt dots fulfill the demands for use in field-coupled logic devices.
  • Keywords
    Hall effect devices; coercive force; ferromagnetic materials; focused ion beam technology; logic devices; micromagnetics; nanostructured materials; temperature measurement; thermal stability; Hall current device; Hall effect measurements; coercivity; ferromagnetic Co/Pt films; field-coupled computing devices; field-coupled logic devices; focused ion beam irradiation; magnetic bistable states; micromagnetic simulations; read-out ability; size 250 nm; temperature measurements; thermal stability; ultra-low volume ferromagnetic nanodots; Magnetic domain walls; Magnetic domains; Magnetic multilayers; Magnetic resonance imaging; Magnetic separation; Saturation magnetization; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
  • Conference_Location
    Sevilla
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-6658-0
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2010.5618385
  • Filename
    5618385