• DocumentCode
    2807257
  • Title

    Macro-modeling of transistor level receiver circuits

  • Author

    Mutnury, Bhyrav ; Swaminathan, Madhavan ; Cases, Moises ; Pham, Nam ; De Araujo, Daniel N. ; Matoglu, Erdem

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2004
  • fDate
    25-27 Oct. 2004
  • Firstpage
    243
  • Lastpage
    246
  • Abstract
    A modeling methodology for macro-modeling transistor level receiver circuits has been proposed. A few receiver modeling techniques have been proposed in the past, but these modeling techniques only address the loading effect of the receiver circuits i.e., the input characteristics of the receivers. In this work, the proposed modeling approach addresses both the loading effect of the receiver as well as the output characteristics of the receiver. The proposed modeling technique is simple, accurate and has huge computational speed-up over transistor level receiver circuits. A recurrent neural network (RNN) model is used to model the loading effect of the receiver. The output characteristics of the receiver is modeled using a combination of receiver static characteristics and a delay element that takes into account the timing delay of the receiver. The accuracy of the modeling approach has been tested on a few test cases and results show good accuracy.
  • Keywords
    delays; digital integrated circuits; driver circuits; integrated circuit modelling; receivers; recurrent neural nets; transistor circuits; delay element; digital integrated circuits; driver circuits; loading effect; macromodeling; receiver modeling techniques; receiver static characteristics; recurrent neural network; timing delay; transistor level receiver circuits; Circuit testing; Delay; Driver circuits; Drives; Load modeling; Protection; Recurrent neural networks; Spline; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
  • Print_ISBN
    0-7803-8667-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2004.1407599
  • Filename
    1407599