DocumentCode
2808188
Title
Characterization of key coating properties of immersion tin for PWB
Author
Yau, Yung-Herng ; Wang, Xingping ; Wang, Cai ; Ye, PingPing ; Wengenroth, Karl ; Abys, Joseph
Author_Institution
Cookson Electron., West Haven
fYear
2007
fDate
1-3 Oct. 2007
Firstpage
223
Lastpage
228
Abstract
In order to meet the requirement of RoHS, including the elimination of lead from electronic components, the printed circuit board industry is moving away from lead bearing hot air solder leveled final finishes to alternative materials. Immersion tin has been available on the market for some time, in spite of its high manufacturing cost and difficulties in processing, because it provides a thick, uniform metallic coating for improved ICT probe life, lubricity for press fit pins, and excellent solderability. Since the formation of intermetallic compounds of Cu6Sn5 and Cu3Sn between the copper substrate and tin coating decreases the solderability and induces whiskers, various methods have been used in the formulation of immersion tin chemistries to retard the intermetallic formation process. This paper compares several immersion tin coatings through the investigation of the kinetics of intermetallic growth and phase transformation by using sequential electrochemical reduction analysis; and the associated solderability by wetting balance test. The intermetallic growth and whisker formation are related to coating compositions and crystal morphologies.
Keywords
coating techniques; copper alloys; electrochemical analysis; phase transformations; printed circuit manufacture; tin; whiskers (crystal); Cu3Sn; Cu6Sn5; PWB; coating compositions; crystal morphologies; immersion tin coatings; intermetallic growth; key coating properties; phase transformation; sequential electrochemical reduction analysis; solderability; wetting balance test; whisker formation; Coatings; Copper; Electronic components; Electronics industry; Intermetallic; Lead; Manufacturing industries; Manufacturing processes; Printed circuits; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology, 2007. IMPACT 2007. International
Conference_Location
Taipei
Print_ISBN
978-1-4244-1636-3
Electronic_ISBN
978-1-4244-1637-0
Type
conf
DOI
10.1109/IMPACT.2007.4433604
Filename
4433604
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