DocumentCode
2810653
Title
Kernel Principal Component Chart for Defect Detection
Author
Stefatos, George ; Luo, Yan ; Hamza, A. Ben
Author_Institution
Concordia Univ., Montreal
fYear
2007
fDate
22-26 April 2007
Firstpage
598
Lastpage
601
Abstract
We present a multivariate statistical process control chart using kernel principal component analysis. The proposed control chart is robust to outliers, and its control limits are derived from the eigenanalysis of the Gaussian kernel matrix in the Hilbert feature space. Our experimental results show that the much improved performance of the proposed control in comparison with existing monitoring and controlling charts.
Keywords
Gaussian processes; Hilbert spaces; control charts; eigenvalues and eigenfunctions; matrix algebra; multivariable systems; principal component analysis; robust control; statistical process control; Gaussian kernel matrix; Hilbert feature space; controlling chart; defect detection; eigenanalysis; kernel principal component chart; monitoring chart; multivariate statistical process control chart; robust control; Control charts; Covariance matrix; Hilbert space; Kernel; Monitoring; Principal component analysis; Process control; Quality control; Robust control; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on
Conference_Location
Vancouver, BC
ISSN
0840-7789
Print_ISBN
1-4244-1020-7
Electronic_ISBN
0840-7789
Type
conf
DOI
10.1109/CCECE.2007.154
Filename
4232813
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