DocumentCode
2810905
Title
Degradation of oxide cathode properties in vacuum diode configuration
Author
Gärtner, G. ; Weon, B.M. ; Barrat, D.
Author_Institution
Philips Res. Lab., Aachen, Germany
fYear
2003
fDate
28-30 May 2003
Firstpage
309
Lastpage
310
Abstract
In this paper we investigate the oxide cathode life limiting effects on the basis of accelerated life predictions. In the diode accelerated life tests we found as a typical behaviour not only a shift of the space charge limit corresponding to a change of the diode distance, but also a continuous decrease of the space charge slope form an initial value of 1.46 to 1.40 and even below. We also investigate the sintering shrinkage and I/U characteristics of oxide coating as a function of operating time.
Keywords
cathode-ray tubes; diodes; electron guns; electron tube testing; life testing; oxide coated cathodes; shrinkage; sintering; space charge; vacuum tubes; I/U plot; accelerated life predictions; diode accelerated life tests; oxide cathode degradation properties; oxide cathode life limiting effects; sintering shrinkage; space charge limit; vacuum diode configuration; Acceleration; Cathode ray tubes; Degradation; Diodes; Displays; Life estimation; Life testing; Space charge; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics, 2003 4th IEEE International Conference on
Print_ISBN
0-7803-7699-4
Type
conf
DOI
10.1109/IVEC.2003.1286333
Filename
1286333
Link To Document