• DocumentCode
    2811793
  • Title

    Minimize system reliability variability based on six-sigma criteria considering component operational uncertainties

  • Author

    Jin, Tongdan ; Su, Peter

  • Author_Institution
    Teradyne Inc., Brandford, MA, USA
  • fYear
    2005
  • fDate
    Jan. 24-27, 2005
  • Firstpage
    214
  • Lastpage
    219
  • Keywords
    electrical faults; failure analysis; printed circuits; reliability; six sigma (quality); stochastic processes; temperature distribution; PCB; broadband analog board; component operational uncertainties; electrical derating; electrical device failure rate; electrical stress; printed circuit board; six-sigma criteria; stochastic reliability prediction model; temperature distribution; temperature stress; Capacitors; Consumer electronics; Power system reliability; Predictive models; Printed circuits; Resistors; Stochastic processes; Stress; Temperature; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2005. Proceedings. Annual
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-8824-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2005.1408364
  • Filename
    1408364