• DocumentCode
    2812323
  • Title

    The ENEA activity on applications with FELs

  • Author

    Doria, A. ; Gallerano, G.P. ; Giovenale, E. ; Messina, G. ; Spassovsky, I. ; Petralia, A. ; Gupta, L. ; Aquino, L.D. ; Ramundo, A. ; Foglietti, V. ; Ortolani, M. ; Fukunaga, K.

  • Author_Institution
    Dipt. Tecnol. Fisiche e Nuovi Mater., ENEA, Frascati, Italy
  • fYear
    2009
  • fDate
    28-30 April 2009
  • Firstpage
    546
  • Lastpage
    547
  • Abstract
    Two Free Electron Laser sources have been developed at ENEA-Frascati and are available for a variety of applications: a Compact Free Electron Laser (C-FEL) that provides coherent radiation in the frequency range between 90 and 150 GHz, and a second source, FEL-CATS, which utilizes a peculiar radio-frequency structure to generate coherent emission in the range 0.4 to 0.7 THz without the use of an optical resonator. The high peak power of several kW in 15 to 50 ps pulses, makes these sources particularly suitable for the assessment of exposure limits in biological systems and for long range detection. In particular the C-FEL has been used to systematically investigate the effects of high peak power millimeter wave radiation on model membranes, human lymphocytes and other living specimens.
  • Keywords
    free electron lasers; light sources; terahertz wave imaging; ENEA-Frascati; FEL-CATS; biological systems; coherent radiation; free electron laser sources; frequency 0.4 THz to 0.7 THz; frequency 90 GHz to 150 GHz; human lymphocytes; millimeter wave radiation; model membranes; optical resonator; time 15 ps to 50 ps; Biological system modeling; Biological systems; Biomembranes; Electron emission; Free electron lasers; Humans; Optical pulses; Optical resonators; Power system modeling; Radio frequency; Artworks; Free Electron Laser; Imaging; THz Applications; THz Detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-3500-5
  • Electronic_ISBN
    978-1-4244-3501-2
  • Type

    conf

  • DOI
    10.1109/IVELEC.2009.5193456
  • Filename
    5193456