A scheme to obtain propagation characteristics of multilayer structures using spectral methods

Author

Basterrechea, J. ; Gago, E. ; Catedra, M.F.

Author_Institution

Dept de Electronica, Univ. Cantabria, Santander, Spain

fYear

1991

fDate

24-28 June 1991

Firstpage

1244

Abstract

An application of the conjugate gradient method in combination with the fast Fourier transform (CG-FFT) for the analysis of multilayer structures is presented. The first step in the process is solving the electric field integral equation (EFIE), which is done using a sampling procedure with rooftop functions to represent the induced current and pulses to average the fields. The second step is the computation of the field components at different levels of the structure. Finally, these data can be used to compute the desired parameters for microstrip circuit design purposes. Results obtained with the proposed scheme are presented.<>

Keywords

conjugate gradient methods; fast Fourier transforms; integral equations; strip lines; transmission line theory; CG-FFT method; EFIE; conjugate gradient-fast Fourier transform method; electric field integral equation; microstrip circuit design; multilayer structures; open-ended microstrip structure; propagation characteristics; rooftop functions; sampling procedure; spectral methods; Fourier transforms; Gradient methods; Green´s function methods; Impedance; Metallization; Microstrip; Nonhomogeneous media; Sampling methods; Telecommunications; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1991. AP-S. Digest

Conference_Location

London, Ontario, Canada

Print_ISBN

0-7803-0144-7

Type

conf

DOI

10.1109/APS.1991.175073

Filename

175073