• DocumentCode
    2813732
  • Title

    Effect of ion bombardment on the field emission of a zinc oxide cathode

  • Author

    Yunkang Cui ; Xiaobing Zhang ; Wei Lei ; Yunsong Di ; Jinchan Wang ; Xiaxi Yang

  • Author_Institution
    Sch. of Electron. Sci. & Eng., Southeast Univ., Nanjing, China
  • fYear
    2009
  • fDate
    28-30 April 2009
  • Firstpage
    269
  • Lastpage
    270
  • Abstract
    The effects of ion bombardment on the field emission of screen printed tetrapod zinc oxide cathodes are reported. The field emission characteristics of this cathode degrade strongly after Ar ion bombardment for 10 min at an energy of 3 keV and ion current of 5 muA. The emission current density decreases from 1.65 to 0.32 mA/cm2 at 4.50 V/mum field strength, while the turn-on field increases from 2.16 to 3.11 V/mum at a current density of 0.1 muA/cm2. This result demonstrates that the field emission of the ZnO emitters severely degrades upon ion bombardment. The emission degradation can be attributed to a lower value of the field enhancement factor beta, which is caused by changes of the morphology, and a higher work function phi, which is caused by changes of the surface composition of ZnO.
  • Keywords
    cathodes; current density; electron field emission; vacuum microelectronics; work function; zinc; current 5 muA; emission current density; field emission; field enhancement factor; ion bombardment; screen printed tetrapod zinc oxide cathodes; surface composition; zinc oxide cathode; Argon; Cathodes; Current density; Degradation; Diodes; Displays; Fluid flow; Ion beams; Nanostructures; Zinc oxide; FN-plot; Field emission; Ion bombardment; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-3500-5
  • Electronic_ISBN
    978-1-4244-3501-2
  • Type

    conf

  • DOI
    10.1109/IVELEC.2009.5193534
  • Filename
    5193534