• DocumentCode
    2815936
  • Title

    Advanced packaging and low cost manufacturing techniques for GaAs microwave modules

  • Author

    Niehenke, E.D. ; Sacks, F.E. ; Kline, M.D. ; Simon, A. ; Luce, W.

  • Author_Institution
    Westinghouse Electric Corp., Baltimore, MD, USA
  • fYear
    1990
  • fDate
    7-10 Oct. 1990
  • Firstpage
    89
  • Abstract
    Summary form only given. A new innovative package design using a common RF, DC, and logic carrier with a formed lid structure has been developed for batch processing. Aluminum-silicon composite housings under development offer improved thermal conductivity, lighter weight, lower cost, and the potential of direct attachment of GaAs chips to the housing. Substrate technologies include glass-on-silicon RF substrates which significantly reduce the module part count. A four-to-one reduction in part count and cost was achieved in an RF receiver subassembly using a single substrate and thin-film passive element deposition with this technology. Cofired multilayer ceramic substrates were developed to incorporate logic, power conditions, and RF circuitry. Technologies developed for assemblies include high-precision chip component pick-and-place, automated epoxy chip attachment techniques, and void-free solder attachment using a vacuum system. Vacuum pick-up techniques were developed for the pick-and-place assembly of GaAs MMIC chips to eliminate negative yield factors. Power MMIC chips were effectively soldered with the void-free solder attachment. Highly automated testing techniques have been developed for rapid measurement of pulsed large- and small-signal S-parameters, high dynamic range automated spurious checks, and full S-parameter characterization for all amplitude and phase module settings.<>
  • Keywords
    III-V semiconductors; MMIC; gallium arsenide; hybrid integrated circuits; modules; packaging; Al-Si composite housings; GaAs MMIC chips; GaAs microwave modules; RF receiver subassembly; RF substrates; automated epoxy chip attachment techniques; automated testing techniques; batch processing; cofired multilayered ceramic substrates; common RF, DC, and logic carrier; direct attachment of GaAs chips; formed lid structure; full S-parameter characterization; glass-on-Si; high dynamic range automated spurious checks; innovative package design; lighter weight; low cost manufacturing techniques; packaging; precision chip component pick and place; reduction in part count; semiconductors; single substrate; thermal conductivity; thin-film passive element deposition; void-free solder attachment; Costs; Gallium arsenide; MMICs; Manufacturing; Packaging; Pulse measurements; Radio frequency; Substrates; Thermal conductivity; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual
  • Conference_Location
    New Orleans, LA, USA
  • Type

    conf

  • DOI
    10.1109/GAAS.1990.175456
  • Filename
    175456