• DocumentCode
    2817499
  • Title

    MOVPE growth of GaNAs using tertiarybutylarsine (TBA) and dimethylhydrazine (DMHy)

  • Author

    Moto, Akihiro ; Tanaka, So ; Ikoma, Nobuyuki ; Tanabe, Tatsuya ; Takagishi, Shigenori ; Takahashi, Mitsuo ; Katsuyama, Tsukuru

  • Author_Institution
    Basic High-Technol. Labs., Sumitomo Electr. Ind. Ltd., Hyogo, Japan
  • fYear
    1998
  • fDate
    11-15 May 1998
  • Firstpage
    139
  • Lastpage
    142
  • Abstract
    GaNAs alloys were successfully grown on GaAs substrates by low-pressure MOVPE with all organometallic sources of triethylgallium (TEG), tertiarybutylarsine (TBA), and dimethylhydrazine (DMHy). We studied the incorporation behavior of nitrogen in terms of growth temperature and molar flow ratio of supplied sources. A ratio of TBA to the group III element, As/III, as low as 1.4 was found to be possible to grow GaNAs with good crystalline quality. Since the nitrogen concentration of more than 3% was easily achieved by our growth technique. The combination of TBA-DMHy as V precursors is a candidate for the growth of other III-V alloys containing nitrogen. We observed a decrease in PL intensity with enhancing nitrogen incorporation into solids: lowering growth temperature and increasing the fractional flow ratio of DMHy. In order to recover from degradation in optical properties, Rapid Thermal Annealing (RTA) was demonstrated and found to be effective. Therefore MOVPE using TBA-DMHy combined with post-annealing is expected to obtain GaNAs alloys with high nitrogen concentration as well as excellent optical properties
  • Keywords
    III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; photoluminescence; rapid thermal annealing; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; GaAs; GaAs substrates; GaNAs; crystalline quality; dimethylhydrazine; growth temperature; low-pressure MOVPE; molar flow ratio; nitrogen concentration; photoluminescence intensity; rapid thermal annealing; tertiarybutylarsine; triethylgallium; Crystallization; Epitaxial growth; Epitaxial layers; Gallium arsenide; III-V semiconductor materials; Nitrogen; Rapid thermal annealing; Solids; Temperature; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712421
  • Filename
    712421