DocumentCode
2817499
Title
MOVPE growth of GaNAs using tertiarybutylarsine (TBA) and dimethylhydrazine (DMHy)
Author
Moto, Akihiro ; Tanaka, So ; Ikoma, Nobuyuki ; Tanabe, Tatsuya ; Takagishi, Shigenori ; Takahashi, Mitsuo ; Katsuyama, Tsukuru
Author_Institution
Basic High-Technol. Labs., Sumitomo Electr. Ind. Ltd., Hyogo, Japan
fYear
1998
fDate
11-15 May 1998
Firstpage
139
Lastpage
142
Abstract
GaNAs alloys were successfully grown on GaAs substrates by low-pressure MOVPE with all organometallic sources of triethylgallium (TEG), tertiarybutylarsine (TBA), and dimethylhydrazine (DMHy). We studied the incorporation behavior of nitrogen in terms of growth temperature and molar flow ratio of supplied sources. A ratio of TBA to the group III element, As/III, as low as 1.4 was found to be possible to grow GaNAs with good crystalline quality. Since the nitrogen concentration of more than 3% was easily achieved by our growth technique. The combination of TBA-DMHy as V precursors is a candidate for the growth of other III-V alloys containing nitrogen. We observed a decrease in PL intensity with enhancing nitrogen incorporation into solids: lowering growth temperature and increasing the fractional flow ratio of DMHy. In order to recover from degradation in optical properties, Rapid Thermal Annealing (RTA) was demonstrated and found to be effective. Therefore MOVPE using TBA-DMHy combined with post-annealing is expected to obtain GaNAs alloys with high nitrogen concentration as well as excellent optical properties
Keywords
III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; photoluminescence; rapid thermal annealing; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; GaAs; GaAs substrates; GaNAs; crystalline quality; dimethylhydrazine; growth temperature; low-pressure MOVPE; molar flow ratio; nitrogen concentration; photoluminescence intensity; rapid thermal annealing; tertiarybutylarsine; triethylgallium; Crystallization; Epitaxial growth; Epitaxial layers; Gallium arsenide; III-V semiconductor materials; Nitrogen; Rapid thermal annealing; Solids; Temperature; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location
Tsukuba
ISSN
1092-8669
Print_ISBN
0-7803-4220-8
Type
conf
DOI
10.1109/ICIPRM.1998.712421
Filename
712421
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