DocumentCode
2817595
Title
Molecular dynamics simulation of plasma-surface interactions during dry etching processes
Author
Hamaguchi, Satoshi ; Yamashiro, Mitsuo ; Yamada, Hideaki
Author_Institution
Center for Atomic and Molecular Technologies, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
fYear
2005
fDate
01-03 Sept. 2005
Firstpage
67
Lastpage
70
Abstract
Molecular dynamics (MD) simulations are used to study non-thermal-equilibrium reaction dynamics taking place on the surface during dry etching processes. In MD simulations, the motion of each atom is solved numerically based upon pre-determined interatomic potential functions and data of interest (such as sputtering yields, deposition rates, etch products, etc.) are evaluated from statistical averaging of relevant instantaneous data obtained from the simulations. In this paper, we review our recent MD simulations results on organic polymer etching. Similar simulations were also performed for selective etching processes of silicon and silicon dioxide substrates.
Keywords
Atomic layer deposition; Dry etching; Plasma applications; Plasma chemistry; Plasma materials processing; Plasma simulation; Polymers; Semiconductor materials; Sputter etching; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
Print_ISBN
4-9902762-0-5
Type
conf
DOI
10.1109/SISPAD.2005.201474
Filename
1562026
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