• DocumentCode
    2817595
  • Title

    Molecular dynamics simulation of plasma-surface interactions during dry etching processes

  • Author

    Hamaguchi, Satoshi ; Yamashiro, Mitsuo ; Yamada, Hideaki

  • Author_Institution
    Center for Atomic and Molecular Technologies, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
  • fYear
    2005
  • fDate
    01-03 Sept. 2005
  • Firstpage
    67
  • Lastpage
    70
  • Abstract
    Molecular dynamics (MD) simulations are used to study non-thermal-equilibrium reaction dynamics taking place on the surface during dry etching processes. In MD simulations, the motion of each atom is solved numerically based upon pre-determined interatomic potential functions and data of interest (such as sputtering yields, deposition rates, etch products, etc.) are evaluated from statistical averaging of relevant instantaneous data obtained from the simulations. In this paper, we review our recent MD simulations results on organic polymer etching. Similar simulations were also performed for selective etching processes of silicon and silicon dioxide substrates.
  • Keywords
    Atomic layer deposition; Dry etching; Plasma applications; Plasma chemistry; Plasma materials processing; Plasma simulation; Polymers; Semiconductor materials; Sputter etching; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
  • Print_ISBN
    4-9902762-0-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2005.201474
  • Filename
    1562026