• DocumentCode
    2817640
  • Title

    Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller

  • Author

    van Vonno, N.W. ; Pearce, L.G. ; Wood, G.M. ; White, J.D. ; Thomson, E.J. ; Bernard, T.M. ; Chesley, P.J. ; Hood, R.

  • Author_Institution
    Intersil Corp., Melbourne, FL, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    6
  • Lastpage
    7
  • Abstract
    We report results of total dose and SEE testing of the ISL7884xASRH hardened single-ended current mode PWM controller including discussion of part design, process and radiation testing results. The part is implemented in submicron BiCMOS.
  • Keywords
    BiCMOS integrated circuits; PWM power convertors; integrated circuit testing; BiCMOS; ISL7884xASRH; SEE testing; hardened single-ended current mode PWM controller; process testing; radiation testing; single event testing; total dose testing; Converters; Ions; Pulse width modulation; Radiation effects; Testing; Transient analysis; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619502
  • Filename
    5619502
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817640