• DocumentCode
    2817658
  • Title

    First-Principles Study of Interaction of As-Vacancy and Ring Mechanism of Diffusion under Presence of Ge in Si

  • Author

    Zhang, Jinyu ; Ashizawa, Yoshio ; Oka, Hideki

  • Author_Institution
    Fujitsu R&D Center Co. Ltd, Room B306, Eagle Run Plaza No.26 Xiaoyun Road, Chaoyang District Beijing, China, 100016. Email: zhangjy@frdc.fujitsu.com
  • fYear
    2005
  • fDate
    01-03 Sept. 2005
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    We performed first-principles calculation to study the interaction of As-vacancy and ring mechanism of diffusion under presence of Ge in Si in neutral and positively charged state respectively, in which it is found that the vacancy barrier decreased substantially when it hops around the ring. We believe it indicates that existence of As atom can lower the vacancy migration barrier. The vacancy migration barrier also decreased with existen Ge atom in vicinity. We also calculate As-vacancy ring mechanism in the crystalline Ge. It is found that the formation energy of the vacancy and migration barrier was obviously smaller than that in crystalline Si. All these results support the suggestion that As diffusion can be enhance with presence of Ge, and provide physical insight of As diffusion in Si1-xGex.
  • Keywords
    As; Ge; ring mechanism; vacancy; Chaos; Crystallization; Electronics industry; Fabrication; Germanium silicon alloys; Heterojunction bipolar transistors; Laboratories; MOSFETs; Research and development; Silicon germanium; As; Ge; ring mechanism; vacancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
  • Print_ISBN
    4-9902762-0-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2005.201477
  • Filename
    1562029