DocumentCode
2817658
Title
First-Principles Study of Interaction of As-Vacancy and Ring Mechanism of Diffusion under Presence of Ge in Si
Author
Zhang, Jinyu ; Ashizawa, Yoshio ; Oka, Hideki
Author_Institution
Fujitsu R&D Center Co. Ltd, Room B306, Eagle Run Plaza No.26 Xiaoyun Road, Chaoyang District Beijing, China, 100016. Email: zhangjy@frdc.fujitsu.com
fYear
2005
fDate
01-03 Sept. 2005
Firstpage
79
Lastpage
82
Abstract
We performed first-principles calculation to study the interaction of As-vacancy and ring mechanism of diffusion under presence of Ge in Si in neutral and positively charged state respectively, in which it is found that the vacancy barrier decreased substantially when it hops around the ring. We believe it indicates that existence of As atom can lower the vacancy migration barrier. The vacancy migration barrier also decreased with existen Ge atom in vicinity. We also calculate As-vacancy ring mechanism in the crystalline Ge. It is found that the formation energy of the vacancy and migration barrier was obviously smaller than that in crystalline Si. All these results support the suggestion that As diffusion can be enhance with presence of Ge, and provide physical insight of As diffusion in Si1-x Gex .
Keywords
As; Ge; ring mechanism; vacancy; Chaos; Crystallization; Electronics industry; Fabrication; Germanium silicon alloys; Heterojunction bipolar transistors; Laboratories; MOSFETs; Research and development; Silicon germanium; As; Ge; ring mechanism; vacancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
Print_ISBN
4-9902762-0-5
Type
conf
DOI
10.1109/SISPAD.2005.201477
Filename
1562029
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