DocumentCode
2817716
Title
Geometry-dependence of the DC and AC Response of Ohmic Contact Carbon Nanotube Field Effect Transistors
Author
Pourfath, M. ; Kosina, H. ; Cheong, B.H. ; Park, W.J.
Author_Institution
Institute for Microelectronics, TU Wien, Gußhausstraße 27-29/E360, 1040 Wien, Austria. Phone: +43-1-58801/36014, Fax: +43-1-58801/36099, E-mail: pourfath@iue.tuwien.ac.at
fYear
2005
fDate
01-03 Sept. 2005
Firstpage
91
Lastpage
94
Abstract
In this work the DC and AC responses of ohmic contact carbon nanotube field effect transistors are investigated. To account for ballistic transport in these devices, the coupled system of Poisson and Schrödinger equations was solved. Good agreement between simulation and experimental results confirms the validity of this model. For AC analysis the quasi static approximation was assumed. Simulation results indicate the both the DC and AC response are effectively dependent on the device geometry. Therefore by careful device design, optimized device characteristics can be achieved.
Keywords
Ballistic transport; CNTFETs; Charge carrier processes; Design optimization; Electrons; FETs; Geometry; Ohmic contacts; Photonic band gap; Schrodinger equation;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
Print_ISBN
4-9902762-0-5
Type
conf
DOI
10.1109/SISPAD.2005.201480
Filename
1562032
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