• DocumentCode
    2817716
  • Title

    Geometry-dependence of the DC and AC Response of Ohmic Contact Carbon Nanotube Field Effect Transistors

  • Author

    Pourfath, M. ; Kosina, H. ; Cheong, B.H. ; Park, W.J.

  • Author_Institution
    Institute for Microelectronics, TU Wien, Gußhausstraße 27-29/E360, 1040 Wien, Austria. Phone: +43-1-58801/36014, Fax: +43-1-58801/36099, E-mail: pourfath@iue.tuwien.ac.at
  • fYear
    2005
  • fDate
    01-03 Sept. 2005
  • Firstpage
    91
  • Lastpage
    94
  • Abstract
    In this work the DC and AC responses of ohmic contact carbon nanotube field effect transistors are investigated. To account for ballistic transport in these devices, the coupled system of Poisson and Schrödinger equations was solved. Good agreement between simulation and experimental results confirms the validity of this model. For AC analysis the quasi static approximation was assumed. Simulation results indicate the both the DC and AC response are effectively dependent on the device geometry. Therefore by careful device design, optimized device characteristics can be achieved.
  • Keywords
    Ballistic transport; CNTFETs; Charge carrier processes; Design optimization; Electrons; FETs; Geometry; Ohmic contacts; Photonic band gap; Schrodinger equation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on
  • Print_ISBN
    4-9902762-0-5
  • Type

    conf

  • DOI
    10.1109/SISPAD.2005.201480
  • Filename
    1562032