• DocumentCode
    2817770
  • Title

    Performance of Commercial Off-the-Shelf Microelectromechanical Systems Sensors in a Pulsed Reactor Environment

  • Author

    Holbert, Keith E. ; Heger, A. Sharif ; McCready, Steven S.

  • Author_Institution
    Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    8
  • Lastpage
    8
  • Abstract
    Prompted by the unexpected failure of piezoresistive sensors in both an elevated gamma-ray environment and reactor core pulse tests, we initiated radiation testing of several MEMS piezoresistive accelerometers and pressure transducers to ascertain their radiation hardness. Some commercial off-the-shelf sensors are found to be viable options for use in a high-energy pulsed reactor, but others suffer severe degradation and even catastrophic failure. Although researchers are promoting the use of MEMS devices in radiation-harsh environment, we nevertheless find assurance testing necessary.
  • Keywords
    accelerometers; microsensors; piezoresistive devices; pressure transducers; MEMS piezoresistive accelerometers; commercial off-the-shelf microelectromechanical systems sensors; elevated gamma-ray environment; piezoresistive sensors; pressure transducers; pulsed reactor environment; radiation hardness; radiation testing; reactor core pulse tests; unexpected failure; Accelerometers; Inductors; Micromechanical devices; Piezoresistance; Sensors; Testing; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619509
  • Filename
    5619509