• DocumentCode
    2822599
  • Title

    A 65-nm CMOS temperature-compensated mobility-based frequency reference for Wireless Sensor Networks

  • Author

    Sebastiano, Fabio ; Breems, Lucien ; Makinwa, Kofi ; Drago, Salvatore ; Leenaerts, Domine ; Nauta, Bram

  • Author_Institution
    NXP Semicond., Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    102
  • Lastpage
    105
  • Abstract
    For the first time, a temperature-compensated CMOS frequency reference based on the electron mobility in a MOS transistor is presented. Over the temperature range from -55°C to 125 °C, its frequency spread is less than ±0.5% after a two-point trim and less than ±2.7% after a one-point trim. These results make it suitable for use in Wireless Sensor Network nodes. Fabricated in a baseline 65-nm CMOS process, the 150 kHz frequency reference occupies 0.2 mm2 and draws 42.6 μA from a 1.2-V supply at room temperature.
  • Keywords
    CMOS integrated circuits; MOSFET; electron mobility; wireless sensor networks; CMOS temperature-compensated mobility; MOS transistor; current 42.6 muA; electron mobility; frequency 150 kHz; frequency reference; size 65 nm; temperature -55 C to 125 C; voltage 1.2 V; wireless sensor network; Accuracy; CMOS integrated circuits; Calibration; Oscillators; Temperature measurement; Temperature sensors; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC, 2010 Proceedings of the
  • Conference_Location
    Seville
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-6662-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2010.5619792
  • Filename
    5619792