• DocumentCode
    2822719
  • Title

    Evaluation of principal characteristics of circular resonator in thin film applications

  • Author

    Myllymaki, S. ; Ristolainen, E. ; Heino, P. ; Lehto, A. ; Varjonen, K.

  • Author_Institution
    Tampere Univ. of Technol., Finland
  • fYear
    2003
  • fDate
    5-7 May 2003
  • Firstpage
    204
  • Lastpage
    207
  • Abstract
    A new type of resonator structure has been developed in thin film SOI applications. The resonator has circular shape and vertical vibration. By using conventional SOI chips with other electronics it possible to add this resonator in same structure without complex process steps. The resonator is low mass resonator. It can be used in low frequencies (MHz) and high frequencies (GHz). The resonator has two electrostatically driven electrodes, one directly in resonator and another in substrate. Coupling rods are not needed. Also it is possible to build some kind of transistor on the resonator. By using this component, the transistor can be driven electrostatically. It can have higher voltage-current amplification -ratio than conventional transistor because of mechanic impact. Both strucrures will at least have Q-value of 700, which has been measured in 3,3 MHz in normal room conditions.
  • Keywords
    elemental semiconductors; micromechanical resonators; silicon-on-insulator; 3.3 MHz; Q-value; Si; circular resonator; cupling rods; electrostatically driven electrodes; mechanic impact; resonator structure; thin film SOI applications; thin film applications; transistor; voltage-current amplification ratio; Electrodes; Electrostatics; Frequency; Micromechanical devices; Shape; Silicon; Substrates; Transistors; Vibrations; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS 2003. Symposium on
  • Print_ISBN
    0-7803-7066-X
  • Type

    conf

  • DOI
    10.1109/DTIP.2003.1287037
  • Filename
    1287037