• DocumentCode
    2826911
  • Title

    Experimental Validation of H SISO control for high performance tunneling current measurement system and MIMO extension

  • Author

    Ahmad, Ishtiaq ; Voda, Alina ; Besancon, Gildas

  • Author_Institution
    Lab. de Conception et d´Integration des Syst. (LCIS), ESISAR, Valence, France
  • fYear
    2012
  • fDate
    3-5 Oct. 2012
  • Firstpage
    581
  • Lastpage
    586
  • Abstract
    Ultrahigh measurement precision of tunneling current is one of the key requirements in different nanopositioning and scanning systems. The desired precision of tunneling current measurement in vertical direction can be adversely influenced not only because of the sample surface variations and measurement noise, but also because of the cross-coupling while scanning in the horizontal direction. In this paper, few experimental results by considering the vertical system of tunneling current measurement (at ambient atmosphere) with H SISO controller are presented and a comparison is performed with conventionally used classical PI controller. Further, a dynamic modeling of MIMO plant having vertical tunneling current measurement system with horizontal scanning system in the presence of cross-coupling phenomenon is proposed. Then, a robust H MIMO controller is analyzed in simulations in order to achieve the desired measurement precision of the tunneling current.
  • Keywords
    H control; MIMO systems; PI control; measurement systems; nanopositioning; precision engineering; robust control; scanning tunnelling microscopy; H infinity SISO controller; MIMO extension; MIMO plant; PI controller; cross coupling; dynamic modeling; high performance tunneling current measurement system; horizontal scanning system; measurement noise; nanopositioning; robust H infinity MIMO controller; ultrahigh measurement precision; Current measurement; MIMO; Noise; Noise measurement; Piezoelectric actuators; Tunneling; Voltage measurement; Cross-coupling; H MIMO control; Nanotechnology; Positioning precision; Scanning Tunneling Microscope (STM); Tunneling current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications (CCA), 2012 IEEE International Conference on
  • Conference_Location
    Dubrovnik
  • ISSN
    1085-1992
  • Print_ISBN
    978-1-4673-4503-3
  • Electronic_ISBN
    1085-1992
  • Type

    conf

  • DOI
    10.1109/CCA.2012.6402387
  • Filename
    6402387