DocumentCode
2827582
Title
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)
fYear
1999
fDate
25-29 April 1999
Abstract
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Keywords
VLSI; integrated circuit testing; ATPG; BIST; DFT; IDDQ testing; MCM; MEMS; VLSI testing; analog circuit; boundary scan testing; concurrent checking; core testing; deep submicron technology; defect oriented testing; delay fault testing; diagnosis; dynamic circuit; fault tolerance; high-level testing; high-speed circuit; memory testing; mixed signal circuit; on-line testing; scan path testing; validation; verification;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location
Dana Point, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-0146-X
Type
conf
DOI
10.1109/VTEST.1999.766637
Filename
766637
Link To Document