DocumentCode
2827599
Title
Waveguide Dielectric Resonator Method for Measure Microwave Dielectric Films Properties
Author
Kotelnikov, I. ; Buslov, O. ; Keis, V. ; Kozyrev, A.
Author_Institution
Saint-Petersburg State Electro Tech. Univ., Saint Petersburg
Volume
2
fYear
2006
fDate
Sept. 2006
Firstpage
784
Lastpage
785
Abstract
The design principles for microwave ferroelectric (FE) films a properties (loss tangent, permittivity) measurement on the base of waveguide dielectric resonator (WDR) are developed. The results of FE films and LTCC measurements at frequency 30 GHz are presented
Keywords
dielectric resonators; dielectric waveguides; ferroelectric thin films; microwave materials; microwave measurement; 30 GHz; WDR method; microwave ferroelectric films properties measurement; waveguide dielectric resonator; Dielectric films; Dielectric loss measurement; Dielectric measurements; Ferroelectric films; Ferroelectric materials; Iron; Loss measurement; Microwave measurements; Microwave theory and techniques; Permittivity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-92-8
Electronic_ISBN
966-7968-92-8
Type
conf
DOI
10.1109/CRMICO.2006.256200
Filename
4023482
Link To Document