• DocumentCode
    2827924
  • Title

    Microwave and millimeter wave characterization of high temperature superconducting thin films

  • Author

    MacDonald, A.D. ; Long, S.A. ; Williams, J.T. ; Jackson, D.R.

  • Author_Institution
    Dept. of Electr. Eng., Houston Univ., TX, USA
  • fYear
    1990
  • fDate
    7-11 May 1990
  • Firstpage
    712
  • Abstract
    Stripline transmission line resonators and resonant cavities were used to determine the surface resistance of high-T/sub c/ superconducting materials and were found to be an effective measurement tool. Thin films were found to have surface resistivity values slightly better than those of cooled copper at 20 K in the frequency range from 3 to 26 GHz, while the more nearly single-crystal bulk samples had even lower surface resistivity values in the millimeter-wave frequency range.<>
  • Keywords
    bismuth compounds; calcium compounds; cavity resonators; electric resistance measurement; high-frequency effects; high-temperature superconductors; microwave measurement; strip line components; strontium compounds; superconducting thin films; surface conductivity; 20 K; 3 to 26 GHz; Bi/sub 2/CaSr/sub 2/Cu/sub 2/O/sub y/; SHF; high temperature superconducting thin films; measurement system; microwave characterisation; millimeter wave characterization; resonant cavities; stripline resonators; surface resistance; Conductivity; Electrical resistance measurement; Frequency; Millimeter wave measurements; Resonance; Stripline; Superconducting materials; Superconducting transmission lines; Surface resistance; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1990. AP-S. Merging Technologies for the 90's. Digest.
  • Conference_Location
    Dallas, TX, USA
  • Type

    conf

  • DOI
    10.1109/APS.1990.115208
  • Filename
    115208