DocumentCode
2827994
Title
Interface Characterization by Second-Harmonic Microscopy
Author
Florsheimer, M. ; Bosch, Marc ; Brillert, Ch. ; Fuchs, Henry
Author_Institution
Physical Institute, University Of Miinster, Wilhelm-klemm-strabe 10, D-48 149 Miinster, Germany
fYear
1996
fDate
8-13 Sept. 1996
Firstpage
30
Lastpage
30
Keywords
Cameras; Image reconstruction; Image resolution; Microscopy; Optical polarization; Optical scattering; Optical surface waves; Surface reconstruction; Tensile stress; Wavelet packets;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location
Hamburg, Germany
Print_ISBN
0-7803-3169-9
Type
conf
DOI
10.1109/CLEOE.1996.562007
Filename
562007
Link To Document