DocumentCode
2828297
Title
A test point insertion algorithm for mixed-signal circuits
Author
Zhang, Jinyan ; Huynh, Sam ; Soma, Mani
Author_Institution
Dept. of Electr. Eng., Washington Univ., USA
fYear
1999
fDate
1999
Firstpage
319
Lastpage
324
Abstract
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are proposed: one is for digital devices and the other is for A/D interface components. An industry power supply circuit and a common A/D converter circuit are used to validate our approaches
Keywords
design for testability; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; transfer functions; A/D interface components; digital devices; industry power supply circuit; mixed-signal circuits; test point insertion algorithm; testability measurement; transfer function models; Circuit testing; Controllability; Costs; Current measurement; Design for testability; Digital circuits; Impedance; Observability; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
0-7695-0146-X
Type
conf
DOI
10.1109/VTEST.1999.766682
Filename
766682
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