• DocumentCode
    2828627
  • Title

    Evaluating the fault tolerance capabilities of embedded systems via BDM

  • Author

    Rebaudengo, M. ; Reorda, M. Sonza

  • Author_Institution
    Dipt. di Autom. e Inf., Politecnico di Torino, Italy
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    452
  • Lastpage
    457
  • Abstract
    Fault injection is a viable solution for verifying the correct design and implementation of fault tolerance mechanisms at different levels (hardware and software). The paper discusses the use of the background diagnostic mode (BDM), available on several Motorola microprocessors and microcontrollers, for implementing a fault injection environment. BDM is well suited to implement some of the most critical operations required by a fault injection environment, such as activating the injection procedure, injecting the fault in memory or registers, and observing the faulty system behavior. The characteristics of a BDM-based fault injection environment in terms of intrusiveness, flexibility, time efficiency, and system requirements are analyzed. The authors exploit a prototypical environment they implemented to validate this analysis. As a result, the approach appears to be well suited for implementing low-cost fault injection experiments on simple embedded microprocessor- and microcontroller-based boards. Some limitations are also outlined, mostly in terms of execution time slow-down
  • Keywords
    embedded systems; fault diagnosis; fault tolerant computing; microprocessor chips; BDM; Motorola microcontrollers; Motorola microprocessors; background diagnostic mode; embedded systems; execution time slow-down; fault injection; fault tolerance capabilities; faulty system behavior; flexibility; injection procedure; intrusiveness; time efficiency; Circuit faults; Costs; Embedded system; Fault tolerant systems; Micromotors; Microprocessors; Prototypes; Rail transportation; Registers; Telecommunication computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1999. Proceedings. 17th IEEE
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0146-X
  • Type

    conf

  • DOI
    10.1109/VTEST.1999.766703
  • Filename
    766703