DocumentCode
2829537
Title
Comprehensive assessment of iris image quality
Author
Li, Xingguang ; Sun, Zhenan ; Tan, Tieniu
Author_Institution
Dept. of Autom., Univ. of Sci. & Technol. of China, Hefei, China
fYear
2011
fDate
11-14 Sept. 2011
Firstpage
3117
Lastpage
3120
Abstract
Iris image quality critically determines iris recognition performance and the quality metrics of iris images are also useful prior information for adaptive selection of optimal recognition strategy. Iris image quality is jointly determined by multiple factors such as focus, occlusion, off-angle, deformation, etc. So it is a complex problem to assess the overall quality score of an iris image. This paper proposes a novel framework for comprehensive assessment of iris image quality. The contributions of the paper include three aspects: (i) Three novel approaches are proposed to estimate the quality metrics (QM) of defocus, motion blur and off-angle in an iris image respectively, (ii) A fusion method based on likelihood ratio is proposed to combine six quality factors of an iris image into an unified quality score. (iii) A statistical quantization method based on t-test is proposed to adaptively classify the iris images in a database into a number of quality levels. Extensive experiments demonstrate the proposed framework can effectively assess the overall quality of iris images. And the relationship between iris recognition results and the quality level of iris images can be explicitly formulated.
Keywords
image classification; image fusion; image restoration; iris recognition; statistical analysis; visual databases; adaptive image classification; defocus image; image database; image fusion; image quality assessment; iris recognition; motion blur; off-angle; quality metrics estimation; statistical quantization method; Ice; Image quality; Iris; Iris recognition; Measurement; Robustness; Iris recognition; de-focus; image quality assessment; motion blur; off-angle;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location
Brussels
ISSN
1522-4880
Print_ISBN
978-1-4577-1304-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2011.6116326
Filename
6116326
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