• DocumentCode
    2833672
  • Title

    Cellular automata techniques for compaction based BIST

  • Author

    Miller, D.M. ; Muzio, J.C. ; Serra, M. ; Sun, X. ; Zhang, S. ; McLeod, R.D.

  • Author_Institution
    Dept. of Comput. Sci., Victoria Univ., BC, Canada
  • fYear
    1991
  • fDate
    11-14 Jun 1991
  • Firstpage
    1893
  • Abstract
    An overview is presented of the theory and application of cellular automata (CA) with respect to BIST (built-in self test). In particular, it is shown that CA should be given due consideration as a replacement for LFSRs (linear feedback shift registers). Further work is required to address implementation issues, as an LCAR (linear hybrid cellular automata register) generally requires greater area than an LFSR
  • Keywords
    built-in self test; logic testing; LCAR; built-in self test; cellular automata; compaction based BIST; implementation issues; linear feedback shift registers; linear hybrid cellular automata register; overview; response compaction; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; Hardware; Polynomials; Registers; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991., IEEE International Sympoisum on
  • Print_ISBN
    0-7803-0050-5
  • Type

    conf

  • DOI
    10.1109/ISCAS.1991.176777
  • Filename
    176777