Real time test environment for TDX-10 switching system

Author

Yoon, B.N. ; Kim, J.W. ; Cho, M.H. ; Rhee, W.S. ; Lim, O.S. ; Kwak, D.Y. ; Ko, K.H.

Author_Institution

Electron. & Telecommun. Res. Inst., Daejeon, South Korea

fYear

1989

fDate

22-24 Nov 1989

Firstpage

43

Lastpage

46

Abstract

To ensure the high reliability of a large scale SPC switching system such as TDX-10 which will be the national standard integrated services digital network (ISDN) switching system in South Korea, rigorous tests should be carried out during the system development life cycle. A presentation is made of the overall requirements of the test environment and the properties of the real environment function test system (REFTS). Sample applications are given to describe how the test environment is used to allow maximum efficiency and productivity

Keywords

automatic testing; electronic equipment testing; electronic switching systems; ISDN; REFTS; South Korea; TDX-10 switching system; automatic testing; integrated services digital network; large scale SPC switching system; real environment function test system; real time testing; system development life cycle; test environment; Automatic testing; Electronic equipment testing; Environmental management; Large-scale systems; Life testing; Prototypes; Real time systems; Storage automation; Switching systems; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

TENCON '89. Fourth IEEE Region 10 International Conference

Conference_Location

Bombay

Type

conf

DOI

10.1109/TENCON.1989.176890

Filename

176890