• DocumentCode
    2835590
  • Title

    Development of radiation hard N+-on-P silicon microstrip sensors for super LHC

  • Author

    Hara, K. ; Inoue, K. ; Mochizuki, A. ; Meguro, T. ; Hatano, H. ; Ikegami, Y. ; Kohriki, T. ; Terada, S. ; Unno, Y. ; Yamamura, K. ; Kamata, S.

  • Author_Institution
    Univ. of Tsukuba, Tsukuba
  • Volume
    1
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    633
  • Lastpage
    638
  • Abstract
    Radiation tolerance up to 1015 1-MeV neq/cm2 is required for the silicon microstrip sensors to be operated at the Super LHC experiment. As a candidate for such sensors, we are investigating non-inverting n+-on-p sensors. We manufactured sample sensors of 1 times 1 cm in 4" and 6" processes with implementing different interstrip electrical isolation structures. Industrial high resistive p-type wafers from FZ (float zone) and MCZ (magnetic Czochralski) growth are tested. They are different in crystal orientations <100> and <111> with different wafer resistivities. The sensors were irradiated with 70-MeV protons and evaluated on the leakage current increase, noise figures, electrical strip isolation, full depletion voltage evolution, and charge collection efficiency.
  • Keywords
    position sensitive particle detectors; proton effects; silicon radiation detectors; <100> crystal orientation; <111> crystal orientation; Super LHC; charge collection efficiency; depletion voltage evolution; float zone growth; interstrip electrical isolation structures; magnetic Czochralski growth; proton irradiation; radiation hard n+-on-p silicon microstrip sensors; size 1 cm; wafer resistivities; Conductivity; Large Hadron Collider; Leakage current; Magnetic sensors; Manufacturing industries; Manufacturing processes; Microstrip; Protons; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4436412
  • Filename
    4436412