Ratio parameters: a new signature for exhaustive testing

Author

Pal, A. ; Gupta, I. Sen ; Gorai, R.K.

Author_Institution

Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India

fYear

1989

fDate

22-24 Nov 1989

Firstpage

897

Lastpage

900

Abstract

A new approach for exhaustive testing of combinational circuits is presented. Its main advantage over other testing schemes is that the fault coverage for single stuck-at faults is significantly high. It is also established that for unate functions, all single stuck at faults and multiple stuck at faults at the terminals are testable. It seems that for irredundant realizations of general boolean functions, most of the faults also are detectable. The time needed in this approach is the same as the other existing exhaustive schemes. However, some extra hardware is needed for storage and comparison of the ratio parameters compared to the other exhaustive schemes. The technique is also suitable for the built-in self test (BIST) of VLSI circuits

Keywords

Boolean functions; VLSI; automatic testing; combinatorial circuits; integrated circuit testing; integrated logic circuits; logic testing; BIST; VLSI circuits; boolean functions; built-in self test; combinational circuits; exhaustive testing; fault coverage; ratio parameters; single stuck-at faults; unate functions; Automatic testing; Boolean functions; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Hardware; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

TENCON '89. Fourth IEEE Region 10 International Conference

Conference_Location

Bombay

Type

conf

DOI

10.1109/TENCON.1989.177076

Filename

177076