DocumentCode
283859
Title
A practical model for calculation of the proton induced SEU cross section using experimental heavy ion SEU cross sections
Author
Akkerman, A. ; Lifshitz, Y. ; Levinson, J. ; Hass, M. ; Ilberg, D.
Author_Institution
Soreq Nucl. Res. Center, Yavne, Israel
fYear
1991
fDate
9-12 Sep 1991
Firstpage
509
Lastpage
513
Abstract
Calculations of the proton induced SEU cross sections were performed using the experimental heavy ion SEU cross sections and a simplified model for estimation of the nuclear recoils (fragments) LET distribution. The results of the calculations were verified by comparing them to experimental and other calculational data showing that the proposed approach can be used for quick and practical estimations of the upset rate
Keywords
Monte Carlo methods; electronic engineering computing; ion beam effects; proton effects; semiconductor device models; LET distribution; Monte Carlo calculations; heavy ion SEU cross sections; model; nuclear recoils; proton induced SEU cross sections; semiconductor devices; upset rate; Energy exchange; Energy measurement; Extraterrestrial measurements; Instruction sets; Low earth orbit satellites; Nuclear measurements; Particle beams; Protons; Semiconductor devices; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location
La Grande-Motte
Print_ISBN
0-7803-0208-7
Type
conf
DOI
10.1109/RADECS.1991.213547
Filename
213547
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