• DocumentCode
    2842323
  • Title

    Model-order estimation and reduction of distributed interconnects via improved vector fitting

  • Author

    Min, Sung-Hwan ; Lee, Heeseok ; Song, Eunseok ; Choi, Yun-Seok ; Cho, Tae-je ; Kang, Sa-Yoon ; Oh, Se-Yong ; Swaminathan, Madhavan

  • Author_Institution
    Semicond. Bus., Samsung Electron. Co. Ltd., Gyounggi, South Korea
  • fYear
    2005
  • fDate
    24-26 Oct. 2005
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    This paper introduces an automated method estimating and reducing the order of macromodel for fast transient simulation. The proposed method improves the vector fitting algorithm for extracting the reduced-order macromodel from the accurate macromodel having redundant poles and residues. The performance of the proposed method has been demonstrated through several test cases.
  • Keywords
    integrated circuit interconnections; transient analysis; vectors; distributed interconnects; model-order estimation; reduced-order macromodel; redundant poles; redundant residues; transient simulation; vector fitting; Admittance; Circuit simulation; Electromagnetic scattering; Equivalent circuits; Frequency dependence; Frequency response; Integrated circuit interconnections; Packaging; Power system interconnection; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
  • Print_ISBN
    0-7803-9220-5
  • Type

    conf

  • DOI
    10.1109/EPEP.2005.1563696
  • Filename
    1563696