DocumentCode
2842837
Title
Epitaxy of III–V based channels on Si and transistor integration for 12-10nm node CMOS
Author
Caymax, M. ; Merckling, C. ; Gang Wang ; Orzali, Tommaso ; Weiming Guo ; Vandervorst, W. ; Dekoster, Johan ; Waldron, Niamh ; Thean, A.
Author_Institution
Imec Belgium, Leuven, Belgium
fYear
2012
fDate
27-30 Aug. 2012
Firstpage
159
Lastpage
162
Abstract
Moore´s Law describes the scaling of Si-based CMOS technology in terms of performance, power consumption, area and cost. As we have reached the physical limits of scaling Si channels, alternative materials with higher carrier mobility such as Ge and IIIV compound semiconductors are in order. This paper reviews some of imec´s work on introducing In0.53Ga0.47As in a manufacturable and integratable way into mainstream Si-based CMOS technology. Several major issues are known: dielectric/IIIV interface passivation, mismatch of lattice and crystal structure between IIIV and Si, small bandgap leading to enhanced leakage,... We will discuss mainly the epitaxial growth aspects and the integration of IIIV materials in Si MOSFET devices, and point out some more unexpected materials and device issues.
Keywords
III-V semiconductors; MOSFET; carrier mobility; crystal structure; elemental semiconductors; energy gap; epitaxial growth; gallium arsenide; indium compounds; passivation; semiconductor growth; silicon; Ge semiconductor; III-V based channel epitaxy; IIIV compound semiconductor; IIIV material integration; In0.53Ga0.47As; Moore´s law; Si; Si MOSFET devices; Si-based CMOS technology scaling; bandgap; carrier mobility; crystal structure; dielectric-IIIV interface passivation; enhanced leakage; epitaxial growth; lattice mismatch; node CMOS; physical limits; power consumption; scaling Si channels; transistor integration; CMOS integrated circuits; Indium gallium arsenide; Indium phosphide; Logic gates; Silicon; Substrates; CMOS; compound semiconductors;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials (IPRM), 2012 International Conference on
Conference_Location
Santa Barbara, CA
ISSN
1092-8669
Print_ISBN
978-1-4673-1725-2
Type
conf
DOI
10.1109/ICIPRM.2012.6403346
Filename
6403346
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