DocumentCode
2843026
Title
COUPLING ELECTRON-BEAM PROBING WITH KNOWLEDGE-BASED FAULT LOCALIZATION
Author
Marzouki, M. ; Laurent, J. ; Courtois, B.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
238
Keywords
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Design automation; Dictionaries; Prototypes; Very large scale integration; Voltage; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519515
Filename
519515
Link To Document