• DocumentCode
    2843766
  • Title

    Electrostatic of wound components: analytical results, simulation and experimental validation of the parasitic capacitance

  • Author

    Laveuve, E. ; Keradec, J.-P. ; Bensoam, M.

  • Author_Institution
    Lab. d´Electrotechnique de Grenoble, Saint Martin d´Heres, France
  • fYear
    1991
  • fDate
    Sept. 28 1991-Oct. 4 1991
  • Firstpage
    1469
  • Abstract
    The electrostatic properties of inductors and transformers are investigated. Two devices have been built on the same magnetic core. Both are cylindrical coaxial winding transformers and all the windings are almost identical. These one-layer windings are rolled in the same direction for one transformer and in opposite direction for the other. All the possible connections of the two windings are tested. Based on a simple electrostatic model, these devices are analytically studied and an equivalent circuit is proposed to take electrostatic phenomena into account. Then, an electromagnetic simulation software is used to compute the electrostatic field with the real shapes of wires and coil layers. Capacitances are deduced from stored electrostatic energy in the whole space. Finally, many impedance measurements from 100 Hz to 40 MHz allow the equivalent circuit to be validated.
  • Keywords
    capacitance; digital simulation; electrical engineering computing; electromagnetic fields; equivalent circuits; inductors; magnetic cores; transformers; windings; 100 Hz to 40 MHz; EM fields; cylindrical coaxial winding; digital simulation; electrostatic energy; electrostatics; equivalent circuit; impedance; inductors; magnetic core; model; parasitic capacitance; software; transformers; Analytical models; Circuit testing; Coaxial components; Electromagnetic fields; Electrostatic analysis; Equivalent circuits; Inductors; Magnetic analysis; Magnetic cores; Transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Dearborn, MI
  • Print_ISBN
    0-7803-0453-5
  • Type

    conf

  • DOI
    10.1109/IAS.1991.178054
  • Filename
    178054