DocumentCode

2843818

Title

Temperature effects in circuits using junction transistors

Author

Lin, H. ; Barco, A.

Author_Institution

RCA Labs., Princeton, NJ, USA

fYear

1956

fDate

16-17 Feb. 1956

Firstpage

21

Lastpage

21

Keywords

Circuits; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1956 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1956.1154461

Filename

1154461