DocumentCode
2844658
Title
Fields in the back plane of extended hemi-spherical lens
Author
Dou, W.B. ; Sun, Z.L.
Author_Institution
State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing, China
fYear
1998
fDate
1998
Firstpage
655
Lastpage
658
Abstract
In this paper, the fields distributions in the back plane of an extended hemispherical lens are calculated with the diffraction integration formula. Results are presented that show important properties versus oblique angle of incident plane wave and extension length: diffraction pattern, vectorial characteristics of fields, fields strength. The results provide much information on the imaging properties of the lenses at millimeter wavelengths
Keywords
lenses; millimetre wave imaging; back plane; dielectric substrate lens; diffraction integration; electromagnetic field distribution; extended hemi-spherical lens; millimeter wave imaging; Dielectric substrates; Diffraction; Equations; Lenses; Optical imaging; Optical polarization; Optical refraction; Optical surface waves; Sun; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4308-5
Type
conf
DOI
10.1109/ICMMT.1998.768374
Filename
768374
Link To Document