• DocumentCode
    2847314
  • Title

    Modeling and diagnosis of timed discrete event systems-a factory automation example

  • Author

    Chen, Yi-Liang ; Provan, Gregory

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    4-6 Jun 1997
  • Firstpage
    31
  • Abstract
    Detection and identification of failures is a critical task in the automatic control of large and complex systems. In the realm of discrete event systems, Sampath et al. (1995, 1996) proposed a new approach to failure diagnosis that models the logical behavior of the considered system in terms of state machines and produces an extended observer called a diagnoser for computing diagnoses. We extend this approach to the diagnosis of timed discrete event systems whose temporal and logical behavior are modeled by a framework proposed by Brandin and Wonham (1994). We use a simple real-world factory conveyor example to demonstrate our modeling and diagnosis approach
  • Keywords
    automata theory; conveyors; discrete event systems; factory automation; state estimation; temporal logic; diagnoser; extended observer; factory automation; factory conveyor; failure diagnosis; failures detection; failures identification; logical behavior; state machines; timed discrete event systems; Application software; Automatic control; Communication networks; Computer networks; Delay; Discrete event systems; Event detection; Manufacturing automation; Production facilities; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1997. Proceedings of the 1997
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-3832-4
  • Type

    conf

  • DOI
    10.1109/ACC.1997.611749
  • Filename
    611749