DocumentCode
2847866
Title
Diagnosis of single gate failures in combinational circuits
Author
Hornbuckle, G. ; Spann, R.
Author_Institution
MIT Lincoln Lab., Lexington, Mass., USA
Volume
XII
fYear
1969
fDate
19-21 Feb. 1969
Firstpage
140
Lastpage
141
Abstract
A method for diagnosing arbitrary single-gate failures in combinational logic circuits will be presented. The procedure will locate the faulty gate and describe its failure which may be any detectable transformation of the correct gate function.
Keywords
Anodes; Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Fault location; Joining processes; Labeling; Laboratories; Silicon compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1969.1154720
Filename
1154720
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