• DocumentCode
    2848632
  • Title

    Nanoscale silicon ion-sensitive field-effect transistors for pH sensor and biosensor applications

  • Author

    Jeong-Soo Lee ; Sungho Kim ; Kihyun Kim ; Taiuk Rim ; Yoon-Ha Jeong ; Meyyappan, M.

  • fYear
    2011
  • fDate
    17-18 Nov. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Increased demand for point-of-care diagnostics has provided a strong motivation for the development of lab-on-a chip systems. The most important part to develop the system is to realize sensing components with high sensitivity, high reliability, low power consumption, low noise and small size in a cost- effective way. The Si-nanowire (Si-NW) ion-sensitive field effect transistor (ISFET) has been considered as one of the most promising devices because of the well-established fabrication techniques taking advantage of the low-cost wafer-scale top down methods [1-2]. In this work, the Si-NW ISFETs with embedded Ag/AgCI electrode have been demonstrated. The DC characteristics and the pH response of the Si-NW ISFET were measured and analysed. In addition, the low-frequency noise measurement was performed in order to investigate noise characteristics of the Si-NW ISFETs.
  • Keywords
    biosensors; chemical sensors; elemental semiconductors; embedded systems; ion sensitive field effect transistors; lab-on-a-chip; low-power electronics; nanoelectronics; nanowires; noise measurement; pH measurement; silicon; silver compounds; Ag-AgCl; DC characteristics; Si; Si-NW ISFET; Si-nanowire ion-sensitive field effect transistor; biosensor application; embedded electrode; fabrication techniques; lab-on-a chip systems; low noise; low power consumption; low-cost wafer-scale top down methods; low-frequency noise measurement; nanoscale silicon ion-sensitive field-effect transistors; noise characteristics; pH response; pH sensor application; point-of-care diagnostics; sensing components; Electrodes; Logic gates; Noise; Optical buffering; Semiconductor device measurement; Sensitivity; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
  • Conference_Location
    Tianjin
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-1998-1
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/EDSSC.2011.6117562
  • Filename
    6117562