• DocumentCode
    2851648
  • Title

    Optimization of Interacting Controllers Using K-wise Tests

  • Author

    Gören, Sezer

  • Author_Institution
    Bahccschir Univ., Istanbul
  • fYear
    2007
  • fDate
    16-18 Dec. 2007
  • Firstpage
    169
  • Lastpage
    174
  • Abstract
    Digital systems are represented as a network of interacting components, and often their control units are as well modeled as a network of finite-state machines (FSMs). It is possible that when an FSM ( M2 ) is driven by another FSM (M1 ) as opposed to being driven from outside, some of its states and transitions may never be visited. Such cases may occur when M2 is for example designed as a library component and hence is designed to work in a greater context - not only with M1. Hence, M2 may be logic-minimized - called hierarchical optimization (HO), or the composite machine, M1 rarr M2 may be minimized - called global optimization (GO). We do HO as it is faster though sometimes less globally optimal than GO. Compared to the best previous HO method, we are significantly faster. We extract the composite machine M1 rarr M2 only once. We do combinational simulation as opposed to sequential. Instead of randomly picking from permissible test sequences, we filter out the ones that are k-wise complete. We inject faults and simulate in a topological order and remove multiple redundancies. As a result of our run-time efficiencies, we are also able to handle bigger FSMs than previous literature.
  • Keywords
    cascade control; control engineering computing; finite state machines; hierarchical systems; multivariable control systems; optimisation; FSM; K-wise tests; combinational simulation; composite machine; digital systems; finite-state machines; global optimization method; hierarchical optimization method; interacting controllers; Design optimization; Digital systems; Hardware; Libraries; Minimization methods; Reachability analysis; Redundancy; Runtime; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop, 2007. IDT 2007. 2nd International
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-1824-4
  • Electronic_ISBN
    978-1-4244-1825-1
  • Type

    conf

  • DOI
    10.1109/IDT.2007.4437453
  • Filename
    4437453