• DocumentCode
    2851887
  • Title

    An Incremental Approach for Pattern Diagnosability in Distributed Discrete Event Systems

  • Author

    Ye, Lina ; Dague, Philippe ; Yan, Yuhong

  • Author_Institution
    LRI, Univ. Paris-Sud 11, Orsay, France
  • fYear
    2009
  • fDate
    2-4 Nov. 2009
  • Firstpage
    123
  • Lastpage
    130
  • Abstract
    Diagnosability is a crucial property that determines at design stage how accurate any diagnosis algorithm can be on a partially observable system. Recent work on diagnosability has generalized fault event case to pattern case, which can describe more general objectives for diagnosis problem, but based on global model and global twin plant construction. In this paper, we propose an original framework to solve pattern diagnosability in a distributed way to avoid calculating global objects. We first show how to incrementally accomplish pattern recognition without building global model by propagating only diagnosability relative information between components. Then an efficient way to construct pattern verifier is proposed, which is inspired from the classical twin plant method but with smaller state space, to search for partial critical paths, whose global consistency is subsequently checked. Meanwhile we prove that the result obtained from our distributed approach is on an equality with that from the centralized one but the evaluation result shows that our search state space exploited is only a small subpart of the global twin plant, whose construction is unavoidable in the centralized approach.
  • Keywords
    discrete event systems; large-scale systems; pattern recognition; distributed discrete event system; pattern diagnosability approach; pattern recognition; Algorithm design and analysis; Artificial intelligence; Buildings; Discrete event systems; Fault diagnosis; Pattern analysis; Pattern recognition; State-space methods; Sufficient conditions; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Tools with Artificial Intelligence, 2009. ICTAI '09. 21st International Conference on
  • Conference_Location
    Newark, NJ
  • ISSN
    1082-3409
  • Print_ISBN
    978-1-4244-5619-2
  • Electronic_ISBN
    1082-3409
  • Type

    conf

  • DOI
    10.1109/ICTAI.2009.75
  • Filename
    5365443