How to ensure zero defects from the beginning with semiconductor test methods

Author

Gessner, Bernd

Author_Institution

austriamicrosystems AG, Graz

fYear

2007

fDate

21-26 Oct. 2007

Firstpage

1

Lastpage

2

Abstract

Today, reliability of electronic products is considered as the minimum requirement to ensure the functionality in a safe and reliable way over years. From the semiconductor sector, as the provider from high-integrated circuits, this trend, is one of the main challenges to ensure the reliability of the product, but much more to precisely predict the reliability of those products. austriamicrosystems very early recognized this trend and implemented the zero-defect program over all process steps from design to the end-of-the-life their product. In this paper an overview of the zero-defect program the achievements and the methods are described is shown.

Keywords

electronic products; integrated circuit design; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; quality assurance; austriamicrosystems; electronic product reliability; integrated circuit design; quality assurance; semiconductor test methods; zero-defect program; Area measurement; Electronic equipment testing; Integrated circuit reliability; Manufacturing; Product design; Production; Quality assurance; Semiconductor device reliability; Semiconductor device testing; Space exploration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2007. ITC 2007. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

978-1-4244-1127-6

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2007.4437697

Filename

4437697