DocumentCode
2856182
Title
Hardware/software system for characterization of microwave electronics materials
Author
Gorev, N.B. ; Kodzhespirova, I.F. ; Privalov, E.N. ; Sukhanov, A.I.
Author_Institution
Inst. of Tech. Mech., Nat. Acad. of Sci., Dnepropetrovsk
Volume
2
fYear
2005
fDate
16-16 Sept. 2005
Firstpage
734
Abstract
A hardware/software system for characterization of GaAs thin-film structures is described. The system makes it possible to determine the concentration of vacant deep traps at the film-substrate (or film-buffer layer) interface and to predict the MESFET threshold voltage from C-V measurements under infrared illumination
Keywords
III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; microwave materials; semiconductor thin films; substrates; thin film devices; C-V measurement; GaAs; GaAs thin-film structure; MESFET threshold voltage; hardware-software system; infrared illumination; microwave electronics material; Capacitance-voltage characteristics; Electron traps; Gallium arsenide; Hardware; Lighting; MESFETs; Software systems; Threshold voltage; Transistors; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-80-4
Type
conf
DOI
10.1109/CRMICO.2005.1565114
Filename
1565114
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