• DocumentCode
    2857329
  • Title

    Multiscale Simulations of High Performance Capacitors and Nanoelectronic Devices

  • Author

    Bernholc, J. ; Ranjan, Viresh ; Ribeiro, F. ; Lu, W. ; Yu, L. ; Nardelli, M. Buongiorno

  • Author_Institution
    North Carolina State Univ., Raleigh
  • fYear
    2007
  • fDate
    18-21 June 2007
  • Firstpage
    194
  • Lastpage
    199
  • Abstract
    Recent advances in theoretical methods combined with the advent of massively-parallel supercomputers allow one to reliably simulate the properties of complex materials and device structures from first principles. We describe applications in two general areas: (i) novel polymer composites for ultrahigh density capacitors, necessary for pulsed power applications, such as electric rail guns, power conditioning, and dense electronic circuitry, and (ii) ballistic electron transport in novel molecule-on-semiconductor structures exhibiting negative differential resistance. The phase diagram of P(VDF-CTFE), which has an usually high energy density, is determined as a function of the electric field. The calculations explain the origin of the observed ultra-high capacitance and suggest a systematic route, not limited to polymers, for obtaining nanostructured materials with high energy density. Turning to molecular electronics, we investigated porphyrins between Si leads, which are candidates for molecular memories and logic. We show that they exhibit tunable negative differential resistance (NDR). In some cases, huge peak-to-valley ratios are obtained, which should result in excellent switching behavior.
  • Keywords
    ballistic transport; capacitors; molecular electronics; nanotechnology; ballistic electron transport; dense electronic circuitry; electric rail guns; high performance capacitors; massively-parallel supercomputers; molecular electronics; molecule-on-semiconductor structures; nanoelectronic devices; nanostructured materials; negative differential resistance; peak-to-valley ratios; polymer composites; porphyrins; power conditioning; ultrahigh density capacitors; Capacitors; Circuit simulation; Electron guns; Materials reliability; Nanoscale devices; Polymers; Pulse circuits; Rails; Reliability theory; Supercomputers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    DoD High Performance Computing Modernization Program Users Group Conference, 2007
  • Conference_Location
    Pittsburgh, PA
  • Print_ISBN
    978-0-7695-3088-5
  • Type

    conf

  • DOI
    10.1109/HPCMP-UGC.2007.54
  • Filename
    4437984