• DocumentCode
    2857615
  • Title

    Multi up-gradation software reliability growth model with faults of different severity

  • Author

    Garmabaki, Amir H S ; Aggarwal, Anu G. ; Kapur, P.K.

  • Author_Institution
    Dept. of Math., Islamic Azad Univ., Nur, Iran
  • fYear
    2011
  • fDate
    6-9 Dec. 2011
  • Firstpage
    1539
  • Lastpage
    1543
  • Abstract
    In today´s environment of global competition where each company is trying to prove itself better than its competitors, software company have to continually do up-gradation or add-ons in their software to survive in the market. Each succeeding up-gradation offers some innovative performance enhancement or some new functionality etc distinguishing itself from the past release. But at the same time the amount of risk involved in up-gradation/add-ons of software with regard to introducing new faults or increasing the fault number in the software is also formidable. This model categorizes faults in two types: Type-1 and Type-2 (simple fault, hard fault namely) with respect to time which they take for isolation and removal after their observation. In this paper, we propose new model and new concept of multi release software development environment. The model developed is validated on real data sets for software which has been released in the market with new features.
  • Keywords
    DP industry; globalisation; software reliability; add-ons; fault number; global competition; multiupgradation software reliability growth model; software company; software development environment; Analytical models; Companies; Mathematical model; Software; Software reliability; Testing; Fault Severity; Multi Release; NHPP; Software Reliability; Up-gradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2011 IEEE International Conference on
  • Conference_Location
    Singapore
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4577-0740-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2011.6118175
  • Filename
    6118175