DocumentCode
2857870
Title
Estimation of maximum-likelihood discrete-choice models of the runway configuration selection process
Author
Ramanujam, V. ; Balakrishnan, H.
Author_Institution
Dept. of Civil & Environ. Eng., Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear
2011
fDate
June 29 2011-July 1 2011
Firstpage
2160
Lastpage
2167
Abstract
The runway configuration is the subset of the runways at an airport that are used for arrivals and departures at any time. Many factors, including weather (wind and visibility), expected arrival and departure demand, environmental considerations such as noise abatement procedures, and coordination of flows with neighboring airports, govern the choice of runway configuration. This paper develops a statistical model to characterize this process using empirical observations. In particular, we demonstrate how a maximum-likelihood discrete-choice model of the runway configuration process can be estimated using aggregate traffic count and other archived data at an airport, that are available over 15 minute intervals. We show that the estimated discrete-choice model not only identifies the influence of various factors in decision-making, but also provides significantly better predictions of runway configuration changes than a baseline model based on the frequency of occurrence of different configurations. The approach is illustrated using data from Newark (EWR) and LaGuardia (LGA) airports.
Keywords
air traffic control; airports; decision making; discrete systems; maximum likelihood estimation; LaGuardia airport; Newark airport; aggregate traffic count; airport runway; archived data; arrival demand; decision making; departure demand; empirical observation; environmental consideration; flow coordination; maximum-likelihood discrete-choice model; noise abatement procedure; runway configuration selection process; statistical model; visibility; weather; wind; Airports; Atmospheric modeling; Equations; Estimation; Mathematical model; Noise reduction; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2011
Conference_Location
San Francisco, CA
ISSN
0743-1619
Print_ISBN
978-1-4577-0080-4
Type
conf
DOI
10.1109/ACC.2011.5991446
Filename
5991446
Link To Document