DocumentCode
2858560
Title
A 512 × 320 element silicon imaging device
Author
Rodgers, R.
Author_Institution
RCA Corp., Lancaster, PA, USA
Volume
XVIII
fYear
1975
fDate
12-14 Feb. 1975
Firstpage
188
Lastpage
189
Abstract
CHARGE-COUPLED DEVICE (CCD) technology has been used to fabricate a high-resolution, low-blooming, 512 x 320 element silicon image device that generates standard 525-line TV pictures. The choice of this cell count has been described previously??. The device uses a unique single-layer doped polysilicon gate structure. This structure maintains the basic simplicity of the original single-layer devices (self alignment of gates, no steps in gate structure causing opens, and single mask level for all CCD gates), but avoids the gap charging problem. The individual gates are formed by doping Nt regions in a P-layer of polysilicon on top of the channel oxide. This results in low leakage between gates. Since there are no exposed gaps, a stable sealed channel structure results. The polysilicon layer is transparent to most wavelengths and there are no opaque areas to cause aliasing. Aluminum is used for a low resistance, double-ended gate-bus connection and to supply bonding pads.
Keywords
Current measurement; Dark current; Image resolution; Image storage; Lighting; Optical sensors; Packaging; Signal resolution; Silicon; TV;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1975.1155386
Filename
1155386
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