• DocumentCode
    2858560
  • Title

    A 512 × 320 element silicon imaging device

  • Author

    Rodgers, R.

  • Author_Institution
    RCA Corp., Lancaster, PA, USA
  • Volume
    XVIII
  • fYear
    1975
  • fDate
    12-14 Feb. 1975
  • Firstpage
    188
  • Lastpage
    189
  • Abstract
    CHARGE-COUPLED DEVICE (CCD) technology has been used to fabricate a high-resolution, low-blooming, 512 x 320 element silicon image device that generates standard 525-line TV pictures. The choice of this cell count has been described previously??. The device uses a unique single-layer doped polysilicon gate structure. This structure maintains the basic simplicity of the original single-layer devices (self alignment of gates, no steps in gate structure causing opens, and single mask level for all CCD gates), but avoids the gap charging problem. The individual gates are formed by doping Nt regions in a P-layer of polysilicon on top of the channel oxide. This results in low leakage between gates. Since there are no exposed gaps, a stable sealed channel structure results. The polysilicon layer is transparent to most wavelengths and there are no opaque areas to cause aliasing. Aluminum is used for a low resistance, double-ended gate-bus connection and to supply bonding pads.
  • Keywords
    Current measurement; Dark current; Image resolution; Image storage; Lighting; Optical sensors; Packaging; Signal resolution; Silicon; TV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1975.1155386
  • Filename
    1155386